This thesis presents the development of novel magnetic sensor combined with Atomic Force Microscope probe (AFM) using conventional semiconductor processing techniques and Electron Beam Lithography (EBL). The fabrication of these magnetic sensors was performed on a common micromachined silicon substrate using a generic batch fabrication technique. Sub-micron Hall bar for Scanning Hall probe Microscopy (SHPM) and electromagnetic force coil magnet for Scanning Electromagnetic Force Microscopy (eMFM) were designed and constructed at the apex of Silicon attractive mode cantilever probes. The process demonstrates good control over sensor parameters. Results indicated controllability of Hall bar junction sizes (spatial resolution) to below 100nm a...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...
Scanning electron microscopy (SEM) is a perfect technique for micro-/nano-object imaging [1] and mov...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...
Scanning probe microscopy has become, nowadays, a branch of microscopy widely used to image surfaces...
The project is concerned with the development of methods for the fabrication of magnetic sensor devi...
Innovative surface imaging techniques allowing parallel magnetic and topographical microscopy with n...
This thesis describes the development of a new type of Magnetic Force Microscope (MFM) probe based o...
Magnetic resonance force microscopy (MRFM) is a non-invasive, three-dimensional imaging technique th...
Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging local...
We present a scanning Hall probe microscope operating in ambient conditions. One of the unique featu...
A micromachining method has been developed for fabricating 20µm tall silicon atomic force tips with ...
This article belongs to the Special Issue Advances in Magnetic Force Microscopy.The fabrication of n...
We present a novel method for the fabrication of generic scanned-probe microscope probes by performi...
One of the most popular magnetic field sensors are Hall effect sensors. These semiconductor sensors,...
The further development of magnetic storage towards higher data density requires a profound understa...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...
Scanning electron microscopy (SEM) is a perfect technique for micro-/nano-object imaging [1] and mov...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...
Scanning probe microscopy has become, nowadays, a branch of microscopy widely used to image surfaces...
The project is concerned with the development of methods for the fabrication of magnetic sensor devi...
Innovative surface imaging techniques allowing parallel magnetic and topographical microscopy with n...
This thesis describes the development of a new type of Magnetic Force Microscope (MFM) probe based o...
Magnetic resonance force microscopy (MRFM) is a non-invasive, three-dimensional imaging technique th...
Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging local...
We present a scanning Hall probe microscope operating in ambient conditions. One of the unique featu...
A micromachining method has been developed for fabricating 20µm tall silicon atomic force tips with ...
This article belongs to the Special Issue Advances in Magnetic Force Microscopy.The fabrication of n...
We present a novel method for the fabrication of generic scanned-probe microscope probes by performi...
One of the most popular magnetic field sensors are Hall effect sensors. These semiconductor sensors,...
The further development of magnetic storage towards higher data density requires a profound understa...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...
Scanning electron microscopy (SEM) is a perfect technique for micro-/nano-object imaging [1] and mov...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...