A DLTS study of copper indium diselenide

The work presented in this thesis describes two main parts. The first part describes the implementation of a Deep Level Transient Spectroscopy (DLTS) system. This system was for use in the solid state group at Salford University for characterising deep levels in l-lll-VI_2 compounds, such as CulnSe_2 (CIS), which had been fabricated in the Electronic and Electrical Engineering Department. The system set-up, data processing and results for this developed system are presented. This system is then compared with a commercial DLTS equipment set-up (Bio-Rad DL4600) at UMIST, and the relative advantages and disadvantages compared. The second part concerns the characterisation of deep levels in as-grown p- and n-type CIS grown at Salford University, and the necessary measurements which took place al UMIST in a collaborative program. Sample selection, Schottky device fabrication and pre-DLTS characterisation techniques are briefly explained and their results presented. These techniques include IV, CV, and CT measurements. As complimentary checks, Minority Carrier Transient Spectroscopy (MCTS) and Admittance Spectroscopy were used to check the origins of some features in the DLTS spectra. Results are presented in a systematic way, then discussed and compared with the published literature. An interpretation of these results is attempted. At the end of this thesis a conclusion and farther work recommendations are suggested. (author)SIGLEAvailable from British Library Document Supply Centre-DSC:DXN049579 / BLDSC - British Library Document Supply CentreGBUnited Kingdo