S.T.E.M. analysis of nanometre scale inhomogeneities in semiconductors

Bullock, J

Publication date

January 1988

Abstract

STEM - Scanning Transmission Electron MicroscopeAvailable from British Library Document Supply Centre- DSC:D85852 / BLDSC - British Library Document Supply CentreSIGLEGBUnited Kingdo

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S.T.E.M. analysis of nanometre scale inhomogeneities in semiconductors

Abstract

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S.T.E.M. analysis of nanometre scale inhomogeneities in semiconductors

Abstract

Extracted data

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