Advance detectors for X-ray microscopy

Over the last decade the advances in x-ray microscopy have mainly been due to the development of x-ray source technology and to the micro-fabrication of x-ray optics. These advances have spurred the development of x-ray microscopes that are approaching the best resolution possible in the presence of radiation damage in the specimen. In addition, the development of specimen preparation techniques that reduce tile effects of radiation damage on the specimen are underway. In contrast, tile development or x-ray detectors for x-ray microscopy has been a low priority. The objective of the work was to develop a new detector for x-ray microscopy. This involved the modification of a Thorn EMI electron tube in order to sensitise the multiplier for soil x-rays In the energy range of interest (0.2-6 keV). The electron multiplier was then tested on a repetitive laser plasma source, which has been shown to be eminently suitable for a laboratory scale x-ray microscope, and the Scanning Transmission X-ray Microscope (STXM) at the National Synchrotron Light Source (NSLS), which is the most successful STXM presently in operation. The processed data from tile electron multiplier was used to characterise its response and assess its potential as all alternative to existing detectors. In addition, ID21, the microscopy beamline at the European Synchrotron Radiation Source (ESRF) was studied to assess the need for a beam position monitor close to the exit slit of the monochromator. This involved the ray tracing of the beamline. It was proposed that in the case of a crystal monochromator a beam position monitor based oil the total signal from a photo-emitting blade containing a number of different diameter pinholes was sufficient. However, for a grating monochromator tile beamline design relied upon feedback from a beam position monitor capable of detecting the height of the beam at tile entrance to the microscope. A number of conceptual designs for a monitor that could fulfil this criterion are presented, including a novel method of using a Near Edge X-ray Absorption Fine Structure (NEXAFS) resonance. In principle this could be used to pinpoint a single energy from a grating monochromator. (author)Available from British Library Document Supply Centre-DSC:DXN034975 / BLDSC - British Library Document Supply CentreSIGLEGBUnited Kingdo