Add to ORKGInternational audienceLow voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making caches more susceptible to soft errors. To counter the problem, a plethora of protection schemes are being proposed to reduce the power and area overheads of cache protection. Accurate methods to measure and compare the effectiveness of such schemes are sorely needed. This paper introduces a unified reliability benchmarking framework with PARMA (Precise Analytical Reliability Model for Architecture). PARMA is a rigorous analytical framework to measure the failure rate in the presence of soft errors under any protection scheme. PARMA continuously and accurately accounts for the increase of failure density due to soft err...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
Abstract Exponentially increasing with technology scaling, soft errors have become a serious design ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Abstract—With dramatic scaling in feature size of VLSI technology, the capacity of on-chip L2 cache ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
Abstract Exponentially increasing with technology scaling, soft errors have become a serious design ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Abstract—With dramatic scaling in feature size of VLSI technology, the capacity of on-chip L2 cache ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
Abstract Exponentially increasing with technology scaling, soft errors have become a serious design ...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...