International audienceIn the Sneddon relationship between unloading contact stiffness, elastic modulus and contact area, it is absolutely necessary to introduce a correction factor *alpha* to perform good elastic modulus and hardness measurements by nanoindentation. This is verified in the present paper by comparing the contact area determined from the Sneddon equation in the usual way, to the projected area of the residual indent measured by AFM. For the fused quartz indented by a sharp Berkovich indenter, the tip radius of which is 180 nm, a *alpha* value as high as 1.17-1.19 is evaluated for a load of 10 mN corresponding to a penetration depth of about 300 nm. This correction factor is not a constant having a single value valid for any B...
Nanoindentation has become a common technique for measuring the hardness and elastic-plastic propert...
Nanoindentation techniques have been widely used to measure thin film mechanical properties. One of ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
Methods currently used for analyzing nanoindentation load-displacement data to determine a material`...
Nanoindentation techniques provide a unique opportunity to obtain mechanical properties of materials...
The accurate description of the indentation load–displacement relationship of an elastic sharp inden...
For nanoindentation hardness and Young's modulus measurements the area function of the indenter has ...
AbstractThe conventional method to extract elastic properties in the nanoindentation of linearly ela...
If all components in a nanoindentation system are well calibrated and a reference material has uniqu...
International audienceIn nanoindentation, especially at very low indenter displacements, the indente...
The Oliver and Pharr method for evaluating nanoindentation load–displacement data is based on the me...
Nanoindentation is a widely recognized method for characterizing the mechanical properties of thin f...
The nanoindentation technique has made it possible to measure deformations at extremely low forces a...
International audienceIn nanoindentation, especially at very low indenter displacements, the indente...
The determination of elastic modulus (E) and hardness (H) relies on the accuracy of the contact area...
Nanoindentation has become a common technique for measuring the hardness and elastic-plastic propert...
Nanoindentation techniques have been widely used to measure thin film mechanical properties. One of ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...
Methods currently used for analyzing nanoindentation load-displacement data to determine a material`...
Nanoindentation techniques provide a unique opportunity to obtain mechanical properties of materials...
The accurate description of the indentation load–displacement relationship of an elastic sharp inden...
For nanoindentation hardness and Young's modulus measurements the area function of the indenter has ...
AbstractThe conventional method to extract elastic properties in the nanoindentation of linearly ela...
If all components in a nanoindentation system are well calibrated and a reference material has uniqu...
International audienceIn nanoindentation, especially at very low indenter displacements, the indente...
The Oliver and Pharr method for evaluating nanoindentation load–displacement data is based on the me...
Nanoindentation is a widely recognized method for characterizing the mechanical properties of thin f...
The nanoindentation technique has made it possible to measure deformations at extremely low forces a...
International audienceIn nanoindentation, especially at very low indenter displacements, the indente...
The determination of elastic modulus (E) and hardness (H) relies on the accuracy of the contact area...
Nanoindentation has become a common technique for measuring the hardness and elastic-plastic propert...
Nanoindentation techniques have been widely used to measure thin film mechanical properties. One of ...
International audienceAtomic force microscopy (AFM) allows detecting structures of nanometric scale ...