PCIM Europe 2012 - International Exhibition & Conference for Power Electronics, Intelligent Motion and Power Quality 2012 , Nuremberg, ALLEMAGNE, 08-/05/2012 - 10/05/2012Robustness study of a module on the basis of a representative drive cycle is mandatory for safety reasons, cost and lifetime estimation. The power modules for motor drives are subject to multiple failure modes which are due to many damaging factors. Generally we perform the damage evaluation of power modules by thermal and active power cycling ageing tests. The objective of this paper is to define a method, which enables us to discriminate the criticity of a specific mission profile in order to evaluate and reduce the impact on lifetime. Complementary, a dedicated power...
EPE 2005 - 11th European Conférence on Power Electronics and Applications, Dresde, ALLEMAGNE, 11-/09...
International audienceThe paper presents the impact of thermal cycling frequency on the lifetime of ...
HITEN 2005 - International Conference on High Temperature Electronics, Paris, FRANCE, 06-/09/2005 - ...
The purpose of the thesis report is analyze the reliability of power electronics for heavy hybrid ve...
Active power cycling is a standardized and well-established method for reliability assessment and pr...
In order to meet the through-life reliability targets for power modules, it is critical to understan...
This study presents a study on non-linear accumulative modelling for power module lifetime estimatio...
Power electronics become more and more important for modern society, which depends increasingly on t...
The reliability of power semiconductor modules is typically determined by separate active or passive...
This paper proposes an on-board methodology for monitoring the health of power converter modules in ...
The reliability of electronic devices is dependent upon the conditions to which they are subject. Te...
This work is a contribution to the evaluation of the power cycling reliability of different packagin...
In the reliability theme a central activity is to investigate, characterize and understand the contr...
In the reliability theme a central activity is to investigate, characterize and understand the contr...
This paper proposes an on-board methodology for monitoring the health of power converter modules in ...
EPE 2005 - 11th European Conférence on Power Electronics and Applications, Dresde, ALLEMAGNE, 11-/09...
International audienceThe paper presents the impact of thermal cycling frequency on the lifetime of ...
HITEN 2005 - International Conference on High Temperature Electronics, Paris, FRANCE, 06-/09/2005 - ...
The purpose of the thesis report is analyze the reliability of power electronics for heavy hybrid ve...
Active power cycling is a standardized and well-established method for reliability assessment and pr...
In order to meet the through-life reliability targets for power modules, it is critical to understan...
This study presents a study on non-linear accumulative modelling for power module lifetime estimatio...
Power electronics become more and more important for modern society, which depends increasingly on t...
The reliability of power semiconductor modules is typically determined by separate active or passive...
This paper proposes an on-board methodology for monitoring the health of power converter modules in ...
The reliability of electronic devices is dependent upon the conditions to which they are subject. Te...
This work is a contribution to the evaluation of the power cycling reliability of different packagin...
In the reliability theme a central activity is to investigate, characterize and understand the contr...
In the reliability theme a central activity is to investigate, characterize and understand the contr...
This paper proposes an on-board methodology for monitoring the health of power converter modules in ...
EPE 2005 - 11th European Conférence on Power Electronics and Applications, Dresde, ALLEMAGNE, 11-/09...
International audienceThe paper presents the impact of thermal cycling frequency on the lifetime of ...
HITEN 2005 - International Conference on High Temperature Electronics, Paris, FRANCE, 06-/09/2005 - ...