ESREF 2011 - 22nd European Symposium Reliability of Electron Devices, Failure Physics and Analysis, Bordeaux, FRANCE, 03-/10/2011 - 07/10/2011In automotive power electronics, low cost and reliability requirements both demand to optimize each part of the package in order to increase its life time during use. The wire bonding breakage accounts for one of the most common failures observed on power modules. In particular, the heel crack mechanism, mainly due to Joule self-heating, can occur in the module, leading to its death. Thus, the wire geometry design has to be set up to maximize its endurance. This paper presents an analytical method able to predict the optimal wire length regarding a wire displacement criterion. Finally, comparisons bet...
The weight of electric and electronic components of cars has been uninterruptedly increasing through...
In power electronics modules, heavy aluminium wires, i.e. wire diameters greater than 100 microns, a...
This paper presents mean fatigue lifetime prediction of a wire-bond structure model in power electro...
Solid state power modules are subjected to harsh environmental and operational loads. Identifying th...
The reliability of power electronic devices is mainly limited due to thermo-mechanical fatigue of th...
The subject of this study was to investigate the effect of different geometrical loop shapes on the ...
The main failure cause in state-of-the-art power electronic modules is the bond-wire lift-off. There...
This paper discusses the design for reliability of a wire bond structure in a power electronic modul...
Ribbon bonding technique has recently been used as an alternative to wire bonding in order to improv...
Wire bond degradation is a limiting factor for the lifetime of state of the art power modules. So, t...
In power electronic packages, one of the main limiting factors for the module reliability stems from...
This paper presents a review of the commonly adopted physics-of-failure-based life prediction models...
In a RF power application such as the OMP, the wires are subjected to high current (because of the h...
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone ...
Today a point has been reached where safe operation areas and lifetimes of power modules are limited...
The weight of electric and electronic components of cars has been uninterruptedly increasing through...
In power electronics modules, heavy aluminium wires, i.e. wire diameters greater than 100 microns, a...
This paper presents mean fatigue lifetime prediction of a wire-bond structure model in power electro...
Solid state power modules are subjected to harsh environmental and operational loads. Identifying th...
The reliability of power electronic devices is mainly limited due to thermo-mechanical fatigue of th...
The subject of this study was to investigate the effect of different geometrical loop shapes on the ...
The main failure cause in state-of-the-art power electronic modules is the bond-wire lift-off. There...
This paper discusses the design for reliability of a wire bond structure in a power electronic modul...
Ribbon bonding technique has recently been used as an alternative to wire bonding in order to improv...
Wire bond degradation is a limiting factor for the lifetime of state of the art power modules. So, t...
In power electronic packages, one of the main limiting factors for the module reliability stems from...
This paper presents a review of the commonly adopted physics-of-failure-based life prediction models...
In a RF power application such as the OMP, the wires are subjected to high current (because of the h...
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone ...
Today a point has been reached where safe operation areas and lifetimes of power modules are limited...
The weight of electric and electronic components of cars has been uninterruptedly increasing through...
In power electronics modules, heavy aluminium wires, i.e. wire diameters greater than 100 microns, a...
This paper presents mean fatigue lifetime prediction of a wire-bond structure model in power electro...