International audienceInGaN/GaN nanostructures form the active region of III-nitride emitters (light emitting diodes, laser diodes, single photon emitters) in the visible spectral range. In order to understand the optical performance of these nanostructures it is necessary to obtain a direct correlation of alloy distribution and optical features. With this purpose in mind, laser-assisted atom probe tomography (La-APT) is a unique tool to visualize the three-dimensional distribution of chemical species at the nanometer scale. Recent advances in this technique also offer the possibility of recording simultaneously the photoluminescence spectrum of th
Atom probe tomography (APT) has been used to achieve three-dimensional characterization of a III-nit...
International audienceAtom probe tomography allows for three-dimensional reconstruction of the eleme...
The aim of this thesis was to develop a methodology for the characterization of III-nitride nanostru...
International audienceInGaN/GaN nanostructures form the active region of III-nitride emitters (light...
International audienceAtom probe tomography (APT) has emerged as a valuable tool in the study of nit...
Optoelectronic devices fabricated from nitride semiconductors include blue and green light emitting ...
International audienceAtom Probe Tomography (APT) has emerged as a reliable chemical analysis techni...
Various practical issues affecting atom probe tomography (APT) analysis of III-nitride semiconductor...
International audienceAtom probe tomography (APT) correlated with optical spectroscopy has yielded o...
In microelectronics, the increase in complexity and the reduction of devices dimensions make essenti...
International audienceDue to the continuous miniaturisation of microelectronic devices, the developm...
International audienceThe role of laser assisted atom probe tomography (APT) in microelectronics is ...
Atom probe tomography (APT) has been used to achieve three-dimensional characterization of a III-nit...
International audienceAtom probe tomography allows for three-dimensional reconstruction of the eleme...
The aim of this thesis was to develop a methodology for the characterization of III-nitride nanostru...
International audienceInGaN/GaN nanostructures form the active region of III-nitride emitters (light...
International audienceAtom probe tomography (APT) has emerged as a valuable tool in the study of nit...
Optoelectronic devices fabricated from nitride semiconductors include blue and green light emitting ...
International audienceAtom Probe Tomography (APT) has emerged as a reliable chemical analysis techni...
Various practical issues affecting atom probe tomography (APT) analysis of III-nitride semiconductor...
International audienceAtom probe tomography (APT) correlated with optical spectroscopy has yielded o...
In microelectronics, the increase in complexity and the reduction of devices dimensions make essenti...
International audienceDue to the continuous miniaturisation of microelectronic devices, the developm...
International audienceThe role of laser assisted atom probe tomography (APT) in microelectronics is ...
Atom probe tomography (APT) has been used to achieve three-dimensional characterization of a III-nit...
International audienceAtom probe tomography allows for three-dimensional reconstruction of the eleme...
The aim of this thesis was to develop a methodology for the characterization of III-nitride nanostru...