X-ray beam induced current analysis of CVD diamond detectors in the perspective of a beam tagging hodoscope development for hadrontherapy on-line monitoring

International audienceHighlights• Diamond double stripped beam monitor prototypes for hadrontherapy monitoring.• Chemical Vapor Deposited diamond detector performance evaluated under X-rays.• 2D current maps evaluated on diamond metallized surface using X-rays micro beams.• Time resolution and bunch detection efficiency at contact strip crossing points.AbstractThe intrinsic electronic properties of diamond make it suitable for radiation-hard and very fast detector development with good signal to noise ratios. With the advent of new generations of ion accelerators either for physics (nuclear and high energy physics) or medical applications (hadrontherapy and synchrotron radiation radiotherapy) there is a need for a very accurate beam monitoring in high radiation environments. Diamond is particularly suited to these applications. Fast pulse detection mode for time stamp, and current integration mode for operation as beam monitors at high particle rates are targeted. Commercial single-crystal, polycrystalline and heteroepitaxial diamonds produced by Chemical Vapor Deposited (CVD) method are analyzed and compared by means of X-ray Beam Induced Current (XBIC). Their performance as particle detectors is investigated using a 8.5 keV X-ray photon micro-bunch beam at ESRF (European Synchrotron Radiation Facility). This facility provides a focused (~1 μm) pulsed beam (100 ps bunch duration), producing an almost uniform energy deposit along the beam irradiated volume in the detector, therefore closely mimicking the interaction of single charged particles. The XBIC set-up of the ID21 beamline enabled us to draw 2D response maps of detectors with disk- and strip metal contact patterns. Using the pulse-synchronized XBIC measurements, a time resolution of 150 ps RMS and bunch detection efficiency of ~100% were evaluated at the contact strip crossing points of a first prototype polycrystalline beam monitor