Add to ORKGAn analysis of all the factors which contribute to the electron probe size in a scanning electron microscope and of the correct method of combining those effects to give optimum performance. Assuming perfect specimen preparation the only other factors are the non-local nature of the basic electron interactions and the nature of the display system
High spatial resolution microanalysis in scanning transmission electron microscopes is most easily p...
This paper is a continuation of the description of problems arising in the development and design of...
A review of the Scanning Electron Microscope (SEM) is presented with attention given to its applicat...
An analysis of all the factors which contribute to the electron probe size in a scanning electron mi...
The fundamental limitations on spatial resolution of X-ray microanalysis in the scanning transmissio...
AbstractIn this article, aimed at the non-specialist microscopist rather than the experienced user, ...
Scanning electron microscopy (SEM) is the most preferred method in microstructural analysis today. I...
We assess a selection of electron probes in terms of the spatial resolution with which information c...
We assess a selection of electron probes in terms of the spatial resolution with which information c...
The research aims to produce the theoretical study on the objective magnetic lens to estimate the el...
The aim of this book is to outline the physics of image formation, electron specimen interactions, ...
This is a third edition of the Electron Microscopy and Analysis textbook, which was published by Tay...
This paper is a continuation of the description of problems arising in the development and design of...
Detailed investigating into the effects of spherical and chromatic aberrations, diffraction and the ...
This is a third edition of the Electron Microscopy and Analysis textbook, which was published by Tay...
High spatial resolution microanalysis in scanning transmission electron microscopes is most easily p...
This paper is a continuation of the description of problems arising in the development and design of...
A review of the Scanning Electron Microscope (SEM) is presented with attention given to its applicat...
An analysis of all the factors which contribute to the electron probe size in a scanning electron mi...
The fundamental limitations on spatial resolution of X-ray microanalysis in the scanning transmissio...
AbstractIn this article, aimed at the non-specialist microscopist rather than the experienced user, ...
Scanning electron microscopy (SEM) is the most preferred method in microstructural analysis today. I...
We assess a selection of electron probes in terms of the spatial resolution with which information c...
We assess a selection of electron probes in terms of the spatial resolution with which information c...
The research aims to produce the theoretical study on the objective magnetic lens to estimate the el...
The aim of this book is to outline the physics of image formation, electron specimen interactions, ...
This is a third edition of the Electron Microscopy and Analysis textbook, which was published by Tay...
This paper is a continuation of the description of problems arising in the development and design of...
Detailed investigating into the effects of spherical and chromatic aberrations, diffraction and the ...
This is a third edition of the Electron Microscopy and Analysis textbook, which was published by Tay...
High spatial resolution microanalysis in scanning transmission electron microscopes is most easily p...
This paper is a continuation of the description of problems arising in the development and design of...
A review of the Scanning Electron Microscope (SEM) is presented with attention given to its applicat...