Optimization of systems for parametric monitoring of the reliability of radioelectronic devices

Parametric monitoring of the reliability of a radioelectronic device has been presented as a problem in recognition of two multidimensional normal ensembles. Analytic expressions have been derived for the monitoring-error probabilities. A procedure has been proposed for selecting the most informative parameters. The problem of optimizing the monitoring system according to the number of measurements required for monitoring in the presence of restriction on the error probabilities has been solved. An example has been given