This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.An approach to image the domains and domain walls of small ferromagnetic entities using atomic force microscopy(AFM), with a nonmagnetic AFM probe, has been developed. Exciting the sample in an external acmagnetic field, the distribution of magnetostrictive response at the surface is detected. By this technique, the domains and domain walls of submicron Co dots have been imaged with a 1 nm lateral resolution. In elliptical Co dots with a 350-nm-long axis on a triangular lattice array with 400 nm periodicity, we find evidence for two domains with opposite magnetization orientation across a wall. Th...
We report on imaging of isolated, few nanometers in size, magnetic dots (Co, Ni) by the use of a sca...
This article may be downloaded for personal use only. Any other use requires prior permission of the...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...
The local magnetostriction measurement has become an emerging issue because strain-mediated nanocomp...
We present a magnetic force microscopy (MFM) analysis of arrays of submicron-scale Co dots fabricate...
We present a new way to observe the surface domain distribution of a magnetic sample at a submicrome...
Domain wall probes (DW-probes) were custom-made by modifying standard commercial magnetic force micr...
We report the results of magnetic force microscopy (MFM) investigations of low-coercivity Co nanodis...
The interest in understanding scaling limits of magnetic textures such as domain walls spans the ent...
Understanding and utilizing novel antiferromagnetic (AFM) materials has been recently one of the cen...
Magnetic force microscopy (MFM) is being used to image [Co/Cu].N and pure Co nanowires with diameter...
International audienceThe pulsed laser deposition technique associated with a low energy cluster bea...
We have applied magnetic force microscopy (MFM) with an in situ electromagnet to study the switchi...
Magnetic imaging in the transmission electron microscope (TEM) has been used to examine submicron el...
Atomic probe microscopy techniques are developed to characterize magnetic and crystallographic domai...
We report on imaging of isolated, few nanometers in size, magnetic dots (Co, Ni) by the use of a sca...
This article may be downloaded for personal use only. Any other use requires prior permission of the...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...
The local magnetostriction measurement has become an emerging issue because strain-mediated nanocomp...
We present a magnetic force microscopy (MFM) analysis of arrays of submicron-scale Co dots fabricate...
We present a new way to observe the surface domain distribution of a magnetic sample at a submicrome...
Domain wall probes (DW-probes) were custom-made by modifying standard commercial magnetic force micr...
We report the results of magnetic force microscopy (MFM) investigations of low-coercivity Co nanodis...
The interest in understanding scaling limits of magnetic textures such as domain walls spans the ent...
Understanding and utilizing novel antiferromagnetic (AFM) materials has been recently one of the cen...
Magnetic force microscopy (MFM) is being used to image [Co/Cu].N and pure Co nanowires with diameter...
International audienceThe pulsed laser deposition technique associated with a low energy cluster bea...
We have applied magnetic force microscopy (MFM) with an in situ electromagnet to study the switchi...
Magnetic imaging in the transmission electron microscope (TEM) has been used to examine submicron el...
Atomic probe microscopy techniques are developed to characterize magnetic and crystallographic domai...
We report on imaging of isolated, few nanometers in size, magnetic dots (Co, Ni) by the use of a sca...
This article may be downloaded for personal use only. Any other use requires prior permission of the...
This thesis deals with developing suitable modifications ofScanning Probe Microscopy (SPM) for inves...