This paper analyzes the phase error for a three-dimensional (3D) shape measurement system that utilizes our recently proposed projector defocusing technique. This technique generates seemingly sinusoidal structured patterns by defocusing binary structured patterns and then uses these patterns to perform 3D shape measurement by fringe analysis. However, significant errors may still exist if an object is within a certain depth range, where the defocused fringe patterns retain binary structure. In this research, we experimentally studied a large depth range of defocused fringe patterns, from near-binary to near-sinusoidal, and analyzed the associated phase errors. We established a mathematical phase error function in terms of the wrapped phase...
A widely used method in high-speed 3D shape measurement, color-code fringe projection requires the p...
A widely used method in high-speed 3D shape measurement, color-code fringe projection requires the p...
This paper presents a novel pixel-level resolution 3D profilometry technique that only needs binary ...
This paper analyzes the phase error for a 3-D shape measurement system that utilizes our recently pr...
This paper analyzes the phase error for a three-dimensional (3D) shape measurement system that utili...
Our study shows that the phase error caused by improperly defocused binary structured patterns corre...
The previously proposed binary defocusing technique and its variations have proven successful for hi...
A recently proposed flexible 3D shape measurement technique using a defocused projector [ Opt. Lett....
We present a high-resolution, high-speed three-dimensional (3-D) shape measurement technique that ca...
This paper presents a real-time 3-D, or 4-D, shape measurement technique that can reach the speed li...
With the recent advancements in digital technology, three-dimensional (3-D) shape measurement has pl...
This paper presents a comparative study on three sinusoidal fringe pattern generation techniques wit...
Abstract Background The accuracy of three-dimensional measurement of object surface is always affect...
This Letter investigates the effects of different phase-shifting algorithms on the quality of high-r...
This paper presents a thorough comparison between a phase-based and an intensity-based optimization ...
A widely used method in high-speed 3D shape measurement, color-code fringe projection requires the p...
A widely used method in high-speed 3D shape measurement, color-code fringe projection requires the p...
This paper presents a novel pixel-level resolution 3D profilometry technique that only needs binary ...
This paper analyzes the phase error for a 3-D shape measurement system that utilizes our recently pr...
This paper analyzes the phase error for a three-dimensional (3D) shape measurement system that utili...
Our study shows that the phase error caused by improperly defocused binary structured patterns corre...
The previously proposed binary defocusing technique and its variations have proven successful for hi...
A recently proposed flexible 3D shape measurement technique using a defocused projector [ Opt. Lett....
We present a high-resolution, high-speed three-dimensional (3-D) shape measurement technique that ca...
This paper presents a real-time 3-D, or 4-D, shape measurement technique that can reach the speed li...
With the recent advancements in digital technology, three-dimensional (3-D) shape measurement has pl...
This paper presents a comparative study on three sinusoidal fringe pattern generation techniques wit...
Abstract Background The accuracy of three-dimensional measurement of object surface is always affect...
This Letter investigates the effects of different phase-shifting algorithms on the quality of high-r...
This paper presents a thorough comparison between a phase-based and an intensity-based optimization ...
A widely used method in high-speed 3D shape measurement, color-code fringe projection requires the p...
A widely used method in high-speed 3D shape measurement, color-code fringe projection requires the p...
This paper presents a novel pixel-level resolution 3D profilometry technique that only needs binary ...