This dissertation, consisting of three separate papers, describes Bayesian methods for life test planning and accelerated life test planning with censored data from a log-location-scale distribution, when prior information of the model parameters is available. The first paper studies Bayesian life testing planning with Type II censored data from a Weibull distribution with given shape parameter, where closed form solutions are available. The second paper presents Bayesian methods for life test planning with a general distribution in a log location-scale-family, in which a large sample approximation approach and a simulation approach are developed to evaluate the criterion and provide plan solutions. The third paper describes Bayesian optimu...
This paper provides methods of obtaining Bayesian D-optimal Accelerated Life Test (ALT) plans for se...
This article presents the development of a general Bayes inference model for accelerated life testin...
ABSTRACT: This article presents the development of a general Bayes inference model for accelerated l...
This paper describes a Bayesian method for optimum accelerated life test planning with one accelerat...
This paper describes Bayesian methods for life test planning with censored data from a log-location-...
This paper describes Bayesian methods for life test planning with censored data from a log-location-...
This paper describes Bayesian methods for life test planning with Type II censored data from a Weibu...
<p>Most of the recently developed methods on optimum planning for accelerated life tests (ALT) invol...
Reliability life testing is used for life data analysis in which samples are tested under normal con...
Accelerated life test (ALT) planning in Bayesian framework is studied in this paper with a focus of ...
In a competitive world where products are designed to last for long periods of time, obtaining time-...
A common problem of high-reliability computing is, on the one hand, the magnitude of total testing t...
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
abstract: Accelerated life testing (ALT) is the process of subjecting a product to stress conditions...
Accelerated Destructive Degradation Tests (ADDTs) provide timely product reliability information in ...
This paper provides methods of obtaining Bayesian D-optimal Accelerated Life Test (ALT) plans for se...
This article presents the development of a general Bayes inference model for accelerated life testin...
ABSTRACT: This article presents the development of a general Bayes inference model for accelerated l...
This paper describes a Bayesian method for optimum accelerated life test planning with one accelerat...
This paper describes Bayesian methods for life test planning with censored data from a log-location-...
This paper describes Bayesian methods for life test planning with censored data from a log-location-...
This paper describes Bayesian methods for life test planning with Type II censored data from a Weibu...
<p>Most of the recently developed methods on optimum planning for accelerated life tests (ALT) invol...
Reliability life testing is used for life data analysis in which samples are tested under normal con...
Accelerated life test (ALT) planning in Bayesian framework is studied in this paper with a focus of ...
In a competitive world where products are designed to last for long periods of time, obtaining time-...
A common problem of high-reliability computing is, on the one hand, the magnitude of total testing t...
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
abstract: Accelerated life testing (ALT) is the process of subjecting a product to stress conditions...
Accelerated Destructive Degradation Tests (ADDTs) provide timely product reliability information in ...
This paper provides methods of obtaining Bayesian D-optimal Accelerated Life Test (ALT) plans for se...
This article presents the development of a general Bayes inference model for accelerated life testin...
ABSTRACT: This article presents the development of a general Bayes inference model for accelerated l...