Interferometric Detection of High Frequency Pulses of Ultrasound in Thin Coatings

The US Air Force needs a nondestructive inspection method to validate the integrity of thin films. Thin films are used for their unique mechanical, electrical, and optical properties. The integrity of these films depends on the thickness and adhesion of the films, and their thermal, optical, and electrical properties. A method to measure the thickness an other properties of thin films is required