Computer Assisted Eddy Current Probe Design

For many years, the inspection of components using eddy current (EC) techniques has been playing an important role in the nondestructive evaluation (NDE) industry. There are many factors which affect the probability of detection (POD) of flaws. One important consideration is how to select suitable EC probes to inspect a given test component with certain class of flaws. Commonly, the performance of an EC probe design for a scan is evaluated experimentally by physically constructing prototype probes and perform test scans. This approach is both time-consuming and expensive. In particular, the EC probe has to be reconstructed each time the probe design is changed and the design cycle typically requires a number of iterations before a satisfactory performance is achieved