Energy Dispersive K X-Ray Fluorescence Analysis for On-Line Process Control of Heavy Metal Concentrations

X-ray analysis has traditionally been wavelength dispersive, manpower intensive, and an analytical laboratory tool employing massive and costly x-ray generators and diffraction spectrometers. Following the development of the lithium drifted silicon and germanium [Si(Li) and Ge(Li)] semiconductor radiation detectors in the mid 1960’s, and more recently the high purity germanium detector [HPGe], the analytical technique of energy dispersive x-ray fluorescence analysis (XRFA)1matured during the 1970’s