© 2017 Author(s). The self-assembly and growth of 4-(chloromethyl)-phenyltrichlorosilane (CMPS) nanostructures within nanoholes that were formed within a thin film of octadecyltrichlorosilane (OTS) was studied ex situ using atomic force microscopy (AFM). The effects of selected solvents and temperatures on the growth of the CMPS were investigated to gain insight into the mechanisms of the surface assembly and self-polymerization of CMPS. Surface platforms of nanoholes were generated within a thin film of OTS using particle lithography combined with immersion steps. The film of OTS provided a resist for preventing nonspecific adsorption of CMPS in areas surrounding the nanoholes. The uncovered areas of substrate within the nanoholes were use...
The octadecyl trichlorosilane (OTS) monolayer was formed on Si carrier, and the template regulated b...
A new method of particle lithography is described for preparing rings or nanoporous films of organos...
Atomic force microscopy (AFM), contact angle, and ellipsometry measurements are used to investigate ...
The self-polymerization of 4-chloromethylphenyltrichlorosilane (CMPS) was studied within spatially c...
Particle lithography offers generic capabilities for the high-throughput fabrication of nanopatterns...
Particle lithography offers generic capabilities for the high-throughput fabrication of nanopatterns...
An emerging challenge for nanoscale measurements is to capture and quantify the magnitude of structu...
An emerging challenge for nanoscale measurements is to capture and quantify the magnitude of structu...
Numerous strategies have been devised to register organosilane monolayers for applications ranging f...
An emerging challenge for nanoscale measurements is to capture and quantify the magnitude of structu...
Nanostructures of 4-(chloromethyl)phenyltrichlorosilane (CMPS) were used as a foundation to attach a...
Combining particle lithography with molecular self-assembly provides a practical approach for produc...
© 2018 Patterned arrays of nanoholes and nanorings were prepared using colloidal lithography combine...
© 2016 American Chemical Society. A stepwise chemistry route was used to prepare arrays of polymer n...
The octadecyl trichlorosilane (OTS) monolayer was formed on Si carrier, and the template regulated b...
The octadecyl trichlorosilane (OTS) monolayer was formed on Si carrier, and the template regulated b...
A new method of particle lithography is described for preparing rings or nanoporous films of organos...
Atomic force microscopy (AFM), contact angle, and ellipsometry measurements are used to investigate ...
The self-polymerization of 4-chloromethylphenyltrichlorosilane (CMPS) was studied within spatially c...
Particle lithography offers generic capabilities for the high-throughput fabrication of nanopatterns...
Particle lithography offers generic capabilities for the high-throughput fabrication of nanopatterns...
An emerging challenge for nanoscale measurements is to capture and quantify the magnitude of structu...
An emerging challenge for nanoscale measurements is to capture and quantify the magnitude of structu...
Numerous strategies have been devised to register organosilane monolayers for applications ranging f...
An emerging challenge for nanoscale measurements is to capture and quantify the magnitude of structu...
Nanostructures of 4-(chloromethyl)phenyltrichlorosilane (CMPS) were used as a foundation to attach a...
Combining particle lithography with molecular self-assembly provides a practical approach for produc...
© 2018 Patterned arrays of nanoholes and nanorings were prepared using colloidal lithography combine...
© 2016 American Chemical Society. A stepwise chemistry route was used to prepare arrays of polymer n...
The octadecyl trichlorosilane (OTS) monolayer was formed on Si carrier, and the template regulated b...
The octadecyl trichlorosilane (OTS) monolayer was formed on Si carrier, and the template regulated b...
A new method of particle lithography is described for preparing rings or nanoporous films of organos...
Atomic force microscopy (AFM), contact angle, and ellipsometry measurements are used to investigate ...