We have observed photoluminescence from strained SiGe quantum well layers at energies approximately equal to twice the SiGe band-gap energy. This luminescence is caused by the simultaneous recombination of two electron hole pairs yielding a single photon. Detection of luminescence at twice the band-gap has been previously used in Si to observe luminescence originating from electron-hole droplets, biexcitons, bound multiexciton complexes and polyexcitons. Time resolved spectra at twice the band-gap have been obtained from our SiGe samples prepared by molecular beam epitaxy (MIRE) as well as rapid thermal chemical vapor deposition (RTCVD). This new luminescence clearly distinguishes multiexciton or dense e-h plasma processes from single excit...
Part I of this thesis deals with 3 topics concerning the luminescence from bound multi-exciton com...
We present a theoretical study of the near gap electronic states of Si/Ge based multiple quantum wel...
The electroluminescence (EL) of thick fully strained SiGe layers is investigated in order to clarify...
We have observed visible photoluminescence, at photon energies nearly twice those of the usual near-...
Well-resolved band edge photoluminescence spectra were obtained from SiGe quantum wells of various w...
Strained Sil-xGex quantum wells and multi-quantum wells, synthesized by solid source ebeam evaporate...
We have investigated the photoluminescence (PL) decay from Er implanted, or grown, into strained SiG...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Si1 12xGex/Si multiquantum well (MQW) structures grown by molecular-beam epitaxy exhibit a broad, in...
Photo-luminescence and electro-luminescence from step-graded index SiGe/Si quantum well grown by mol...
Part I of this thesis deals with 3 topics concerning the luminescence from bound multi-exciton com...
We present a theoretical study of the near gap electronic states of Si/Ge based multiple quantum wel...
The electroluminescence (EL) of thick fully strained SiGe layers is investigated in order to clarify...
We have observed visible photoluminescence, at photon energies nearly twice those of the usual near-...
Well-resolved band edge photoluminescence spectra were obtained from SiGe quantum wells of various w...
Strained Sil-xGex quantum wells and multi-quantum wells, synthesized by solid source ebeam evaporate...
We have investigated the photoluminescence (PL) decay from Er implanted, or grown, into strained SiG...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Photoluminescence (PL) emission spectra have been carried out on a partially relaxed Si/Si1-xGex/Si ...
Si1 12xGex/Si multiquantum well (MQW) structures grown by molecular-beam epitaxy exhibit a broad, in...
Photo-luminescence and electro-luminescence from step-graded index SiGe/Si quantum well grown by mol...
Part I of this thesis deals with 3 topics concerning the luminescence from bound multi-exciton com...
We present a theoretical study of the near gap electronic states of Si/Ge based multiple quantum wel...
The electroluminescence (EL) of thick fully strained SiGe layers is investigated in order to clarify...