This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We propose a fault-tolerance evaluation method based on the Belief Propagation (BP) algorithm. Compared with existing approaches, our algorithm is more efficient in terms of memory requirements and CPU time. The algorithm can easily run on multiple CPUs to achieve parallel processing, and thus further reducing memory cost and processing time. The significance of this research is that the proposed algorithm can be used for developing computer-aided nanoscale simulation tools to systemically evaluate circuit fault-tolerant behavior. This knowledge, in turn, can help build more robust nanocircuits. \ua9 2011 American Scientific Publishers.Peer rev...
This thesis is a contribution at the architectural level to the improvement of fault-tolerance in ma...
The error rate in complementary transistor circuits is suppressed exponentially in electron number, ...
The astonishing success story of microelectronics cannot go on indefinitely. In fact, once devices ...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
Abstract — As silicon circuits quickly approach their physical limitations, researchers are actively...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...
This paper presents a new system architecture for implementing fault-tolerant information processing...
ISBN 978-3-540-73006-4International audienceIn future nanotechnologies failure densities are predict...
Nanotechnology-based devices are believed to be the future possible alternative to CMOS-based device...
This paper presents a new approach for monitoring and estimating device reliability of nanometer-sca...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
This article observes the potential for building neural network computing systems designed via use o...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
Abstract. A reliable circuit-design methodology [6] based on simple feed-forward neural networks (wi...
Emerging nanoelectronic memories such as Resistive Random Access Memories (RRAMs) are possible candi...
This thesis is a contribution at the architectural level to the improvement of fault-tolerance in ma...
The error rate in complementary transistor circuits is suppressed exponentially in electron number, ...
The astonishing success story of microelectronics cannot go on indefinitely. In fact, once devices ...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
Abstract — As silicon circuits quickly approach their physical limitations, researchers are actively...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...
This paper presents a new system architecture for implementing fault-tolerant information processing...
ISBN 978-3-540-73006-4International audienceIn future nanotechnologies failure densities are predict...
Nanotechnology-based devices are believed to be the future possible alternative to CMOS-based device...
This paper presents a new approach for monitoring and estimating device reliability of nanometer-sca...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
This article observes the potential for building neural network computing systems designed via use o...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
Abstract. A reliable circuit-design methodology [6] based on simple feed-forward neural networks (wi...
Emerging nanoelectronic memories such as Resistive Random Access Memories (RRAMs) are possible candi...
This thesis is a contribution at the architectural level to the improvement of fault-tolerance in ma...
The error rate in complementary transistor circuits is suppressed exponentially in electron number, ...
The astonishing success story of microelectronics cannot go on indefinitely. In fact, once devices ...