When an undoped heterostructure layer is buried in a conventional GaAs metal-semiconductor-metal photodetector, it is intended to improve the transient response to a pulse of light by preventing carriers that are photogenerated deep in the device from reaching the electrodes. The physics behind this strategy are investigated by means of a two-dimensional, finite-difference simulation of a practical structure. It is argued that previous experimental tests are equivocal because they do not investigate fully all the circumstances that determine the benefit of a buried layer over simpler structures. The simulation suggests that, judged from the fall time of the transient response, there are additional factors to be considered. These include the...
We have simulated the carrier concentration and temporal response characteristics of a Back-Gated Me...
In this paper, we deal with the properties of a family of optical devices based on heterojunction an...
Photoconductive and electro-optic sampling of the photocurrent of GaAs metal-semiconductor-metal- ph...
We use a two-dimensional, drift-diffusion calculation to illustrate the physics behind the recently ...
Photocurrents in a GaAs metal-semiconductor-metal (MSM) photodetector have been numerically modelled...
We present a comprehensive theoretical and experimental analysis of the current response of GaAs met...
The dependence of the photocurrent, in a planar metal-semiconductor-metal photodetectors (MSM), on a...
The successful application of finite element analysis to ultrafast optoelectronic devices is demonst...
Calculations by drift diffusion and Monte Carlo methods and experimental data on the transient respo...
The dependence of the photocurrent, in a planar metal-semiconductor-metal photodetectors (MSM), on a...
A semiconductor with a high resistivity due to a deep trap is called a semi-insulator. A semi-insula...
We have simulated the transient response of metal\u2013semiconductor\u2013metal (MSM) photodetectors...
The partial illumination of a metal-semiconductor-metal photodetector (MSM-PD) was modeled using a o...
Different gain mechanisms are observed in metal-semiconductor-metal (MSM) photodetectors consisting ...
As symmetrical data characteristics I (V) of the Metal-Semiconductor-Metal (MSM) photodetector, we w...
We have simulated the carrier concentration and temporal response characteristics of a Back-Gated Me...
In this paper, we deal with the properties of a family of optical devices based on heterojunction an...
Photoconductive and electro-optic sampling of the photocurrent of GaAs metal-semiconductor-metal- ph...
We use a two-dimensional, drift-diffusion calculation to illustrate the physics behind the recently ...
Photocurrents in a GaAs metal-semiconductor-metal (MSM) photodetector have been numerically modelled...
We present a comprehensive theoretical and experimental analysis of the current response of GaAs met...
The dependence of the photocurrent, in a planar metal-semiconductor-metal photodetectors (MSM), on a...
The successful application of finite element analysis to ultrafast optoelectronic devices is demonst...
Calculations by drift diffusion and Monte Carlo methods and experimental data on the transient respo...
The dependence of the photocurrent, in a planar metal-semiconductor-metal photodetectors (MSM), on a...
A semiconductor with a high resistivity due to a deep trap is called a semi-insulator. A semi-insula...
We have simulated the transient response of metal\u2013semiconductor\u2013metal (MSM) photodetectors...
The partial illumination of a metal-semiconductor-metal photodetector (MSM-PD) was modeled using a o...
Different gain mechanisms are observed in metal-semiconductor-metal (MSM) photodetectors consisting ...
As symmetrical data characteristics I (V) of the Metal-Semiconductor-Metal (MSM) photodetector, we w...
We have simulated the carrier concentration and temporal response characteristics of a Back-Gated Me...
In this paper, we deal with the properties of a family of optical devices based on heterojunction an...
Photoconductive and electro-optic sampling of the photocurrent of GaAs metal-semiconductor-metal- ph...