Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample. We demonstrate atomic resolution by imaging of the KBr(001) surface in ambient conditions by frequency-modulation atomic force microscopy with a cantilever based on a quartz tuning fork (qPlus sensor) and analyze both long- and short-range contributions to the damping. The thickness of the hydration layer increases with relative humidity; thus varying humidity enables us to study the influence of the hydration layer thickness on cantilever damping. Starting with measurements of damping ...
True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency...
True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency...
In bimodal frequency modulation atomic force microscopy (FM-AFM), two flexural modes are excited sim...
Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in v...
Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in v...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
Frequency-modulation atomic force microscopy has turned into a well-established method to obtain ato...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
Frequency modulation atomic force microscopy (FM-AFM) has made imaging of surfaces in ultrahigh vacu...
Frequency modulation atomic force microscopy (FM-AFM) has made imaging of surfaces in ultrahigh vacu...
True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency...
True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency...
In bimodal frequency modulation atomic force microscopy (FM-AFM), two flexural modes are excited sim...
Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in v...
Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in v...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
Frequency-modulation atomic force microscopy has turned into a well-established method to obtain ato...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor,...
Frequency modulation atomic force microscopy (FM-AFM) has made imaging of surfaces in ultrahigh vacu...
Frequency modulation atomic force microscopy (FM-AFM) has made imaging of surfaces in ultrahigh vacu...
True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency...
True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency...
In bimodal frequency modulation atomic force microscopy (FM-AFM), two flexural modes are excited sim...