Nonradiative power dissipation within and near the active region of a high power single mode slab coupled optical waveguide laser is directly measured by CCD-based thermoreflectance, including its variation with device bias. By examining the high spatial resolution temperature profile at the optical output facets, we quantify heat spreading from the source in the active region both downward to the substrate and upward to the metal top contact. © 2006 by ASME and MIT Lincoln Laboratory.link_to_subscribed_fulltex
In this paper we present results of the analysis of the thermoreflectance (TR) measurements performe...
International audienceThermal characterization of semiconductor lasers is an important issue for opt...
International audienceThermal characterization of semiconductor lasers is an important issue for opt...
In semiconductor lasers, key parameters such as threshold current, efficiency, wavelength, and lifet...
The performances of laser diodes operating in continuous wave regime, in terms of lifetime, output p...
The performances of laser diodes operating in continuous wave regime, in terms of lifetime, output p...
The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensio...
Abstract. The performances of laser diodes operating in continuous wave regime, in terms of lifetime...
The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensio...
We map a laser's internal temperature structure for the first time, identifying separate heat source...
Nonradiative recombination and other heat generation processes affect both the performance and lifet...
We present a thermoreflectance imaging system using a focused laser sweeping the device under test w...
We present a thermoreflectance imaging system using a focused laser sweeping the device under test w...
We present a thermoreflectance imaging system using a focused laser sweeping the device under test w...
International audienceWe present a thermoreflectance imaging system using a focused laser sweeping t...
In this paper we present results of the analysis of the thermoreflectance (TR) measurements performe...
International audienceThermal characterization of semiconductor lasers is an important issue for opt...
International audienceThermal characterization of semiconductor lasers is an important issue for opt...
In semiconductor lasers, key parameters such as threshold current, efficiency, wavelength, and lifet...
The performances of laser diodes operating in continuous wave regime, in terms of lifetime, output p...
The performances of laser diodes operating in continuous wave regime, in terms of lifetime, output p...
The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensio...
Abstract. The performances of laser diodes operating in continuous wave regime, in terms of lifetime...
The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensio...
We map a laser's internal temperature structure for the first time, identifying separate heat source...
Nonradiative recombination and other heat generation processes affect both the performance and lifet...
We present a thermoreflectance imaging system using a focused laser sweeping the device under test w...
We present a thermoreflectance imaging system using a focused laser sweeping the device under test w...
We present a thermoreflectance imaging system using a focused laser sweeping the device under test w...
International audienceWe present a thermoreflectance imaging system using a focused laser sweeping t...
In this paper we present results of the analysis of the thermoreflectance (TR) measurements performe...
International audienceThermal characterization of semiconductor lasers is an important issue for opt...
International audienceThermal characterization of semiconductor lasers is an important issue for opt...