Ultrafast electron microscopy (UEM) has been demonstrated as an effective table-top technique for imaging the temporally evolving dynamics of matter with a subparticle spatial resolution on the timescale of atomic motion. However, imaging the faster motion of electron dynamics in real time has remained beyond reach. Here we demonstrate more than an order of magnitude (16 times) enhancement in the typical temporal resolution of UEM by generating isolated ∼30 fs electron pulses, accelerated at 200 keV, via the optical-gating approach, with sufficient intensity to probe efficiently the electronic dynamics of matter. Moreover, we investigate the feasibility of attosecond optical gating to generate isolated subfemtosecond electron pulses and att...
Light–matter interactions at the nanoscale are fundamental to the rapidly developing fields of plasm...
The development of ultrafast electron microscopy (UEM) and variants thereof (e.g., photon-induced ne...
The development of ultrafast electron microscopy (UEM) and variants thereof (e.g., photon-induced ne...
Ultrafast electron microscopy (UEM) has been demonstrated as an effective table-top technique for im...
Ultrafast electron microscopy (UEM) has been demonstrated as an effective table-top technique for im...
Ultrafast electron microscopy (UEM) is a pivotal tool for imaging of nanoscale structural dynamics w...
The development of Ultrafast Electron Microscopy (UEM) and diffraction (UED) permit the imaging of a...
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which e...
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which e...
We advance ultrafast electron microscopy from atomic motions into the domain of electron-dynamics. S...
In this contribution, we consider the advancement of ultrafast electron diffraction and microscopy t...
In this contribution, we consider the advancement of ultrafast electron diffraction and microscopy t...
Ultrafast measurement technology provides essential contributions to our understanding of the proper...
Pulsed electron beams allow for the direct atomic-scale observation of structures with femtosecond t...
Light–matter interactions at the nanoscale are fundamental to the rapidly developing fields of plasm...
Light–matter interactions at the nanoscale are fundamental to the rapidly developing fields of plasm...
The development of ultrafast electron microscopy (UEM) and variants thereof (e.g., photon-induced ne...
The development of ultrafast electron microscopy (UEM) and variants thereof (e.g., photon-induced ne...
Ultrafast electron microscopy (UEM) has been demonstrated as an effective table-top technique for im...
Ultrafast electron microscopy (UEM) has been demonstrated as an effective table-top technique for im...
Ultrafast electron microscopy (UEM) is a pivotal tool for imaging of nanoscale structural dynamics w...
The development of Ultrafast Electron Microscopy (UEM) and diffraction (UED) permit the imaging of a...
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which e...
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which e...
We advance ultrafast electron microscopy from atomic motions into the domain of electron-dynamics. S...
In this contribution, we consider the advancement of ultrafast electron diffraction and microscopy t...
In this contribution, we consider the advancement of ultrafast electron diffraction and microscopy t...
Ultrafast measurement technology provides essential contributions to our understanding of the proper...
Pulsed electron beams allow for the direct atomic-scale observation of structures with femtosecond t...
Light–matter interactions at the nanoscale are fundamental to the rapidly developing fields of plasm...
Light–matter interactions at the nanoscale are fundamental to the rapidly developing fields of plasm...
The development of ultrafast electron microscopy (UEM) and variants thereof (e.g., photon-induced ne...
The development of ultrafast electron microscopy (UEM) and variants thereof (e.g., photon-induced ne...