Add to ORKGThe use of thin, self-supporting carbon catcher foils allows one to measure sputtering yields in a broad range of materials with high sensitivity. Analyzing the foils with Rutherford forward scattering, we have measured sputtered Al, Si and P surface densities down to 5 × 10^(13) with uncertainties of about 20%
Scanning transmission ion microscopy (STIM) has been applied to measure sputter yields of thin Kovar...
Because of recent interest in the role played by the thermal properties of materials that exhibit hi...
Because of recent interest in the role played by the thermal properties of materials that exhibit hi...
The use of thin, self-supporting carbon catcher foils allows one to measure sputtering yields in a b...
The use of thin, self-supporting carbon catcher foils allows one to measure sputtering yields in a b...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
The sputtering yield of carbon was measured in the electronic energy loss regime by 194-MeV Au ions ...
The sputtering yield of carbon was measured in the electronic energy loss regime by 194-MeV Au ions ...
We have measured the yields of 90 keV ^(40)Ar^+ and ^4He^+ sputtering of Mo and V samples by the use...
We have measured the yields of 90 keV ^(40)Ar^+ and ^4He^+ sputtering of Mo and V samples by the use...
We have measured the yields of 90 keV ^(40)Ar^+ and ^4He^+ sputtering of Mo and V samples by the use...
Scanning transmission ion microscopy (STIM) has been applied to measure sputter yields of thin Kovar...
Because of recent interest in the role played by the thermal properties of materials that exhibit hi...
Because of recent interest in the role played by the thermal properties of materials that exhibit hi...
The use of thin, self-supporting carbon catcher foils allows one to measure sputtering yields in a b...
The use of thin, self-supporting carbon catcher foils allows one to measure sputtering yields in a b...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
International audienceAn innovative experimental equipment allowing to study the sputtering induced ...
The sputtering yield of carbon was measured in the electronic energy loss regime by 194-MeV Au ions ...
The sputtering yield of carbon was measured in the electronic energy loss regime by 194-MeV Au ions ...
We have measured the yields of 90 keV ^(40)Ar^+ and ^4He^+ sputtering of Mo and V samples by the use...
We have measured the yields of 90 keV ^(40)Ar^+ and ^4He^+ sputtering of Mo and V samples by the use...
We have measured the yields of 90 keV ^(40)Ar^+ and ^4He^+ sputtering of Mo and V samples by the use...
Scanning transmission ion microscopy (STIM) has been applied to measure sputter yields of thin Kovar...
Because of recent interest in the role played by the thermal properties of materials that exhibit hi...
Because of recent interest in the role played by the thermal properties of materials that exhibit hi...