Several different models have been employed for modeling the dielectric function of hexagonal GaN in the range from 1 to 10 eV. Models are compared in terms of number of parameters required, intricacy of model equations, and possibility of accurate estimation of important physical parameters, such as energies of critical points and exciton binding energies. Shortcomings and advantages of each model are discussed in detail. Excellent agreement with the experimental data for GaN has been achieved with three of the investigated models. It has also been shown that an assumption of adjustable broadening instead of a purely Lorentzian one improves the agreement with the experimental data and enables elimination of excessive absorption below the g...
The optical constants of a range of semiconductors, from wide bandgap materials (GaN and AlN) over m...
Inverse of Dielectric Function of highly doped GaN has been calculated by using Lindhard formalism....
The reflectance of basal-plane epitaxial layers of GaN has been measured between 5 and 30 eV, and Kr...
An adjustable broadening function instead of the conventional Lorentzian one is incorporated in the ...
Optical constants of hexagonal GaN (in the range 1.5-10 eV), InN (in the range 2-10 eV), and AlN (in...
In this work we propose an analytical expression for the complex dielectric function that includes b...
In this work we propose an analytical expression for the complex dielectric function which includes ...
Calculations of the optical constants of hexagonal GaN (in the range 1-10 eV), InN (in the range 2-2...
A review on the experimental determination of the dielectric function for hexagonal nitride semicond...
We present a detailed analysis of interband transition structures in the dielectric function of GaN....
We present a detailed analysis of interband transition structures in the dielectric function of GaN....
weitere beteiligte Personen: Dr. Andreas Hangleiter Stefan Potthast Donald J. A
weitere beteiligte Personen: Dr. Andreas Hangleiter Stefan Potthast Donald J. A
weitere beteiligte Personen: Dr. Andreas Hangleiter Stefan Potthast Donald J. A
The complex dielectric function ɛ and the E0 excitonic and band-edge critical-point structures of he...
The optical constants of a range of semiconductors, from wide bandgap materials (GaN and AlN) over m...
Inverse of Dielectric Function of highly doped GaN has been calculated by using Lindhard formalism....
The reflectance of basal-plane epitaxial layers of GaN has been measured between 5 and 30 eV, and Kr...
An adjustable broadening function instead of the conventional Lorentzian one is incorporated in the ...
Optical constants of hexagonal GaN (in the range 1.5-10 eV), InN (in the range 2-10 eV), and AlN (in...
In this work we propose an analytical expression for the complex dielectric function that includes b...
In this work we propose an analytical expression for the complex dielectric function which includes ...
Calculations of the optical constants of hexagonal GaN (in the range 1-10 eV), InN (in the range 2-2...
A review on the experimental determination of the dielectric function for hexagonal nitride semicond...
We present a detailed analysis of interband transition structures in the dielectric function of GaN....
We present a detailed analysis of interband transition structures in the dielectric function of GaN....
weitere beteiligte Personen: Dr. Andreas Hangleiter Stefan Potthast Donald J. A
weitere beteiligte Personen: Dr. Andreas Hangleiter Stefan Potthast Donald J. A
weitere beteiligte Personen: Dr. Andreas Hangleiter Stefan Potthast Donald J. A
The complex dielectric function ɛ and the E0 excitonic and band-edge critical-point structures of he...
The optical constants of a range of semiconductors, from wide bandgap materials (GaN and AlN) over m...
Inverse of Dielectric Function of highly doped GaN has been calculated by using Lindhard formalism....
The reflectance of basal-plane epitaxial layers of GaN has been measured between 5 and 30 eV, and Kr...