A study was conducted on the positron-electron autocorrelation function of defect center in silicon. The positron annihilation lifetime spectroscopy (PALS) spectra taken on the as-grown and defected samples of silicon were studied. It was found that the positron binding energy to the defect could be estimated from the ratio of the positron-electron autocorrelates for bulk crystal and defect trapped positron states.published_or_final_versio
Measuring the Doppler broadening of the positron annihilation radiation or the angular correlation b...
Vacancy defects and their effect on electrical deactivation in highly doped silicon have been studie...
Unlike its conventional applications in lattice defect characterization, positron annihilation lifet...
ABSTRACT: Various point defects in silicon are studied theoretically from the point view of positron...
Various point defects in silicon are studied theoretically from the point view of positron annihilat...
Measurements of Doppler-broadening of annihilation radiation from variable-energy positrons have bee...
Positron states at pure monovacancies and divacancies and vacancy-phosphorus pairs in Si as well as ...
Positron annihilation spectroscopy is particularly suitable for studying vacancy-type defects in sem...
In silicon processing technology one of the most important current objectives is to achieve a contro...
Defect centers generated in crystalline silicon by MeV Si implants have been investigated by a combi...
High momentum parts of the momentum distribution of annihilation photons are examined both theoretic...
A theory for calculating the momentum distribution of annihilating positron-electron pairs in solids...
AbstractIntrinsic point defects exist in all semiconducting materials. Their identification and meas...
We report a computational first-principles study of positron trapping at vacancy defects in metals a...
A proposed design of the variable energy positron annihilation spectroscopy (VEPALS) system based on...
Measuring the Doppler broadening of the positron annihilation radiation or the angular correlation b...
Vacancy defects and their effect on electrical deactivation in highly doped silicon have been studie...
Unlike its conventional applications in lattice defect characterization, positron annihilation lifet...
ABSTRACT: Various point defects in silicon are studied theoretically from the point view of positron...
Various point defects in silicon are studied theoretically from the point view of positron annihilat...
Measurements of Doppler-broadening of annihilation radiation from variable-energy positrons have bee...
Positron states at pure monovacancies and divacancies and vacancy-phosphorus pairs in Si as well as ...
Positron annihilation spectroscopy is particularly suitable for studying vacancy-type defects in sem...
In silicon processing technology one of the most important current objectives is to achieve a contro...
Defect centers generated in crystalline silicon by MeV Si implants have been investigated by a combi...
High momentum parts of the momentum distribution of annihilation photons are examined both theoretic...
A theory for calculating the momentum distribution of annihilating positron-electron pairs in solids...
AbstractIntrinsic point defects exist in all semiconducting materials. Their identification and meas...
We report a computational first-principles study of positron trapping at vacancy defects in metals a...
A proposed design of the variable energy positron annihilation spectroscopy (VEPALS) system based on...
Measuring the Doppler broadening of the positron annihilation radiation or the angular correlation b...
Vacancy defects and their effect on electrical deactivation in highly doped silicon have been studie...
Unlike its conventional applications in lattice defect characterization, positron annihilation lifet...