Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions
- Díaz Caballero, Elena
- Belenguer Martínez, Ángel
- Esteban González, Héctor
- Boria Esbert, Vicente Enrique
Publication date
January 2013
DOI Publisher
Institution of Engineering and Technology (IET)Abstract
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip-to-SIW transitions are de-embedded from the measurements of the SIW structure by a thru-reflect-line calibration with an adequate and cheap SIW calibration kit.Díaz Caballero, E.; Belenguer Martínez, Á.; Esteban González, H.; Boria Esbert, VE. (2013). Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions. Electronics Letters. 49(2):132-133. doi:10.1049/el.2012.3027S13213349
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