This work presents a method for force calibration of rectangular atomic force microscopy (AFM) microcantilevers under heavy fluid loading. Theoretical modeling of the thermal response of microcantilevers is discussed including a fluid-structure interaction model of the cantilever-fluid system that incorporates the results of the fluctuation-dissipation theorem. This model is curve fit to the measured thermal response of a cantilever in de-ionized water and a cost function is used to quantify the difference between the theoretical model and measured data. The curve fit is performed in a way that restricts the search space to parameters that reflect heavy fluid loading conditions. The resulting fitting parameters are used to calibrate the can...
Different methods for the determination of cantilever properties in non-contact atomic force microsc...
The spring constant of an atomic force microscope cantilever is often needed for quantitative measur...
A calibration method is presented for determining the spring constant of atomic force microscope (AF...
<p>This research presents new calibration techniques for the characterization of atomic force micro...
Item does not contain fulltextSingle-molecule force spectroscopy studies performed by Atomic Force M...
The scientific community needs a rapid and reliable way of accurately determining the stiffness of a...
Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs) strongly rel...
The measurement of cantilever parameters is an essential part of performing a calibrated measurement...
International audienceThe use of atomic force microscopy in nanomechanical measurements requires acc...
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
Atomic Force Microscopy (AFM) has become a widely used technique to measure mechanical properties of...
© 2003 Dr. James Won Min ChonIn the last decade, atomic force microscopy (AFM) has emerged as a fund...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical pro...
It is crucial to calibrate atomic force microscope (AFM) cantilevers for the development and further...
Different methods for the determination of cantilever properties in non-contact atomic force microsc...
The spring constant of an atomic force microscope cantilever is often needed for quantitative measur...
A calibration method is presented for determining the spring constant of atomic force microscope (AF...
<p>This research presents new calibration techniques for the characterization of atomic force micro...
Item does not contain fulltextSingle-molecule force spectroscopy studies performed by Atomic Force M...
The scientific community needs a rapid and reliable way of accurately determining the stiffness of a...
Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs) strongly rel...
The measurement of cantilever parameters is an essential part of performing a calibrated measurement...
International audienceThe use of atomic force microscopy in nanomechanical measurements requires acc...
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
Atomic Force Microscopy (AFM) has become a widely used technique to measure mechanical properties of...
© 2003 Dr. James Won Min ChonIn the last decade, atomic force microscopy (AFM) has emerged as a fund...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical pro...
It is crucial to calibrate atomic force microscope (AFM) cantilevers for the development and further...
Different methods for the determination of cantilever properties in non-contact atomic force microsc...
The spring constant of an atomic force microscope cantilever is often needed for quantitative measur...
A calibration method is presented for determining the spring constant of atomic force microscope (AF...