Add to ORKGA probe station, suitable for the electrical characterization of integrated circuits at cryogenic temperatures is presented. The unique design incorporates all moving components inside the cryostat at room temperature, greatly simplifying the design and allowing automated step and repeat testing. The system can characterize wafers up to 100 mm in diameter, at temperatures <20 K. It is capable of highly repeatable measurements at millimeter-wave frequencies, even though it utilizes a Gifford McMahon cryocooler which typically imposes limits due to vibration. Its capabilities are illustrated by noise temperature and S-parameter measurements on low noise amplifiers for radio astronomy, operating at 75–116 GHz
In this paper, we demonstrate non-destructive cryogenic probing of monolithic microwave integrated c...
New low-noise cryogenic input transmission lines have been developed for the Deep Space Network (DSN...
In this paper, we review recent progress at Georgia Tech's Microwave Application Group towards the d...
A probe station, suitable for the electrical characterization of integrated circuits at cryogenic te...
A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices an...
Significant advances in the development of high electron-mobility field-effect transistors (HEMT's) ...
The purpose of this thesis was to develop very low noise cryogenic receivers and related high accura...
Advances in device fabrication, modelling and design techniques have made wide band, low noise cryog...
A broadband low-noise four-stage high-electron-mobility transistor amplifier was designed and charac...
Contains report on one research project.National Aeronautics and Space Administration (Contract NAG3...
The measurement of cryogenic antennas poses unique logistical problems since the antenna under test ...
With a growing effort in research and development of an alternative material to bulk Nb for a superc...
AbstractLBNL is developing an innovative data acquisition module for superconductive magnets where t...
A measurement system has been developed for cryogenic on-wafer characterization at 50-110 GHz. The m...
A cryogen-free cryostat was set up in order to perform measurements at ultra low temperatures. The s...
In this paper, we demonstrate non-destructive cryogenic probing of monolithic microwave integrated c...
New low-noise cryogenic input transmission lines have been developed for the Deep Space Network (DSN...
In this paper, we review recent progress at Georgia Tech's Microwave Application Group towards the d...
A probe station, suitable for the electrical characterization of integrated circuits at cryogenic te...
A cryogenic measurement system capable of performing on-wafer RF testing of semiconductor devices an...
Significant advances in the development of high electron-mobility field-effect transistors (HEMT's) ...
The purpose of this thesis was to develop very low noise cryogenic receivers and related high accura...
Advances in device fabrication, modelling and design techniques have made wide band, low noise cryog...
A broadband low-noise four-stage high-electron-mobility transistor amplifier was designed and charac...
Contains report on one research project.National Aeronautics and Space Administration (Contract NAG3...
The measurement of cryogenic antennas poses unique logistical problems since the antenna under test ...
With a growing effort in research and development of an alternative material to bulk Nb for a superc...
AbstractLBNL is developing an innovative data acquisition module for superconductive magnets where t...
A measurement system has been developed for cryogenic on-wafer characterization at 50-110 GHz. The m...
A cryogen-free cryostat was set up in order to perform measurements at ultra low temperatures. The s...
In this paper, we demonstrate non-destructive cryogenic probing of monolithic microwave integrated c...
New low-noise cryogenic input transmission lines have been developed for the Deep Space Network (DSN...
In this paper, we review recent progress at Georgia Tech's Microwave Application Group towards the d...