We report the development of a general analytic method for describing the responsivity and resolution for a pixellated semiconductor detector structure in terms of device and material properties. The method allows both drift and diffusive transport to be modelled, for which previously only Monte Carlo techniques have been available. We obtain a general solution, and show specific results for an array of square pixels, illustrating the device constraints required to optimize spatial and spectral resolution
We developed a numerical solver for the drift–diffusion and Poisson equations in one-dimensional sem...
All imaging techniques involving x-rays and gamma-rays have limitations imposed by the detector tech...
Using simulations and analytical approaches, we have studied single hit resolutions obtained with a ...
In this thesis the work will focus on the modelling of highly pixellated solid-state devices. Result...
Monochromatic X and gamma rays are a standard calibration tool for semiconductor detector. For finel...
X-ray imaging with spectral resolution, “Color X-ray imaging” is a new imaging technology that is cu...
In this thesis the work will focus on the modelling of highly pixellated solid- state devices. Resul...
PSD10International audienceSilicon detectors have gained in popularity since silicon became a widely...
Existence of the natural diffusive spread of charge carriers on the course of their drift towards co...
Existence of the natural diffusive spread of charge carriers on the course of their drift towards co...
A fully spectroscopic Monte Carlo model has been developed to predict the spectroscopic performance ...
The fabrication of semiconductor imaging arrays with optimum spectroscopic capabilities requires the...
The Voxel Imaging PET (VIP) Pathfinder project intends to show the advantages of using pixelated sem...
Imaging spectrometers based on a fully depleted silicon substrate are sensitive over the whole devic...
With the renewed concept of "Materials by Design" attracting particular attentions from the engineer...
We developed a numerical solver for the drift–diffusion and Poisson equations in one-dimensional sem...
All imaging techniques involving x-rays and gamma-rays have limitations imposed by the detector tech...
Using simulations and analytical approaches, we have studied single hit resolutions obtained with a ...
In this thesis the work will focus on the modelling of highly pixellated solid-state devices. Result...
Monochromatic X and gamma rays are a standard calibration tool for semiconductor detector. For finel...
X-ray imaging with spectral resolution, “Color X-ray imaging” is a new imaging technology that is cu...
In this thesis the work will focus on the modelling of highly pixellated solid- state devices. Resul...
PSD10International audienceSilicon detectors have gained in popularity since silicon became a widely...
Existence of the natural diffusive spread of charge carriers on the course of their drift towards co...
Existence of the natural diffusive spread of charge carriers on the course of their drift towards co...
A fully spectroscopic Monte Carlo model has been developed to predict the spectroscopic performance ...
The fabrication of semiconductor imaging arrays with optimum spectroscopic capabilities requires the...
The Voxel Imaging PET (VIP) Pathfinder project intends to show the advantages of using pixelated sem...
Imaging spectrometers based on a fully depleted silicon substrate are sensitive over the whole devic...
With the renewed concept of "Materials by Design" attracting particular attentions from the engineer...
We developed a numerical solver for the drift–diffusion and Poisson equations in one-dimensional sem...
All imaging techniques involving x-rays and gamma-rays have limitations imposed by the detector tech...
Using simulations and analytical approaches, we have studied single hit resolutions obtained with a ...