Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy
- Souza Neto, Narcizo Marques de
- RAMOS, Aline Y.
- TOLENTINO, Helio C. N.
- MARTINS, Alessandro
- Santos, Antonio Domingues dos
Publication date
January 2009
DOI Publisher
WILEY-BLACKWELL PUBLISHING, INC Journal
issn:0021-8898Abstract
A method of using X-ray absorption spectroscopy together with resolved grazing-incidence geometry for depth profiling of atomic, electronic or chemical local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.LNLS/ABTLuS/MCT - Brazilian Synchrotron Light LaboratoryCNPqCoordenacao de Aperfeicoamento de Pessoal de Nivel Superior (CAPES
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