Add to ORKGWe present a method for x-ray phase-contrast imaging and metrology applications based on the sample-induced modulation and subsequent computational demodulation of a random or periodic reference interference pattern. The proposed unified modulated pattern analysis (UMPA) technique is a versatile approach and allows tuning of signal sensitivity, spatial resolution, and scan time. We characterize the method and demonstrate its potential for high-sensitivity, quantitative phase imaging, and metrology to overcome the limitations of existing methods
Summary. — Phase-based approaches can revolutionize X-ray imaging and remove its main limitation: po...
We present a new method to analyze quantitatively the wave front of a partially coherent x-ray beam....
Purpose: Edge illumination (EI) X-ray phase-contrast imaging (XPCI) has been under development at U...
9siWe present a method for x-ray phase-contrast imaging and metrology applications based on the samp...
We present a method for x-ray phase-contrast imaging and metrology applications based on the sample-...
X-ray phase-contrast and dark-field imaging provides valuable, complementary information about the s...
8siX-ray phase-contrast techniques are powerful methods for discerning features with similar densiti...
Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fl...
The current advances in new generation X-ray sources are calling for the development and improvement...
We present an alternative laboratory implementation of x-ray phase-contrast tomography through a bea...
Two-dimensional (2D) Talbot array illuminators (TAIs) were designed, fabricated, and evaluated for h...
The development of phase contrast methods for diagnostic x-ray imaging is inspired by the potential ...
X-ray phase contrast and dark-field imaging were proven to have a great potential for medical diagno...
The development of phase contrast methods for diagnostic x-ray imaging is inspired by the potential ...
During the past twenty years, there has been a growing interest in X-ray phase contrast imaging. Thi...
Summary. — Phase-based approaches can revolutionize X-ray imaging and remove its main limitation: po...
We present a new method to analyze quantitatively the wave front of a partially coherent x-ray beam....
Purpose: Edge illumination (EI) X-ray phase-contrast imaging (XPCI) has been under development at U...
9siWe present a method for x-ray phase-contrast imaging and metrology applications based on the samp...
We present a method for x-ray phase-contrast imaging and metrology applications based on the sample-...
X-ray phase-contrast and dark-field imaging provides valuable, complementary information about the s...
8siX-ray phase-contrast techniques are powerful methods for discerning features with similar densiti...
Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fl...
The current advances in new generation X-ray sources are calling for the development and improvement...
We present an alternative laboratory implementation of x-ray phase-contrast tomography through a bea...
Two-dimensional (2D) Talbot array illuminators (TAIs) were designed, fabricated, and evaluated for h...
The development of phase contrast methods for diagnostic x-ray imaging is inspired by the potential ...
X-ray phase contrast and dark-field imaging were proven to have a great potential for medical diagno...
The development of phase contrast methods for diagnostic x-ray imaging is inspired by the potential ...
During the past twenty years, there has been a growing interest in X-ray phase contrast imaging. Thi...
Summary. — Phase-based approaches can revolutionize X-ray imaging and remove its main limitation: po...
We present a new method to analyze quantitatively the wave front of a partially coherent x-ray beam....
Purpose: Edge illumination (EI) X-ray phase-contrast imaging (XPCI) has been under development at U...