Analysis of Parameter Variability in Integrated Devices by Partial Least Squares Regression

International audienceThis paper focuses on the application of the partial least squares (PLS) regression to the uncertainty quantification of the responses of complex stochastic systems. It considers the development of a surrogate model using a limited set of training samples in order to estimate statistical quantities of the system output with relatively low computational cost compared to the standard brute force Monte Carlo (MC) simulation. The performance and the strength of the proposed modeling scheme is investigated for an integrated voltage regulator (IVR) with 8 random variables. The results highlight the ability of the PLS regression to deals with complex nonlinear problems with very few principal components, also providing important insights about the input variables. © 2020 IEEE