An Initial Calibration of a Proton Induced X-ray Emission (PIXE) Material Analysis System Using GUPIXWin

Proton induced x-ray emission (PIXE) technology has been used extensively over the last few decades to perform highly accurate multi-elemental trace element analyses with much success. The recent implementation of a new PIXE experimental chamber at East Carolina University required a qualification and calibration of the Amptek Fast SDD©, a new state of the art silicon drift diode (SDD) detector, and GUPIXWin, a highly utilized analysis software package. Using 55Fe, a radioactive x-ray source, the detector performed as expected with a resolution of (130 ± 4) eV and a peak to background ratio of 19 000 ± 1000:1. Several thin and thick, mono- and bi-elemental standards were selected to calibrate and calculate the H parameter necessary for trace element concentrations. An energy dependent set of values for H [almost equal to] 0:002 was determined. Finally, the calibration settings were tested by performing a trace element to matrix element ratio analysis on striped bass otoliths from a previous experiment. These results were compared to the previously collected data with few ratios in agreement. Of all analyzed element ratios, Mn:Ca had the most agreement. Some ratios were nearly one order of magnitude different. Recommendations for beam current settings and further calibrations were made