Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach 

[[abstract]]The effective recognition of unnatural control chart patterns (CCPs) is a critical issue in statistical process control, as unnatural CCPs can be associated with specific assignable causes adversely affecting the process. Machine learning techniques, such as artificial neural networks (ANNs), have been widely used in the research field of CCP recognition. However, ANN approaches can easily overfit the training data, producing models that can suffer from the difficulty of generalization. This causes a pattern misclassification problem when the training examples contain a high level of background noise (common cause variation). Support vector machines (SVMs) embody the structural risk minimization, which has been shown to be superior to the traditional empirical risk minimization principle employed by ANNs. This research presents a SVM-based CCP recognition model for the on-line real-time recognition of seven typical types of unnatural CCP, assuming that the process observations are AR(1) correlated over time. Empirical comparisons indicate that the proposed SVM-based model achieves better performance in both recognition accuracy and recognition speed than the model based on a learning vector quantization network. Furthermore, the proposed model is more robust toward background noise in the process data than the model based on a back propagation network. These results show the great potential of SVM methods for on-line CCP recognition. (C) 2011 Elsevier Ltd. All rights reserved.[[note]]SC