Patch Contour Matching by Correlating Fourier Descriptors

Fourier descriptors (FDs) is a classical but still popular method for contour matching. The key idea is to apply the Fourier transform to a periodic representation of the contour, which results in a shape descriptor in the frequency domain. Fourier descriptors have mostly been used to compare object silhouettes and object contours; we instead use this well established machinery to describe local regions to be used in an object recognition framework. We extract local regions using the Maximally Stable Extremal Regions (MSER) detector and represent the external contour by FDs. Many approaches to matching FDs are based on the magnitude of each FD component, thus ignoring the information contained in the phase. Keeping the phase information requires us to take into account the global rotation of the contour and shifting of the contour samples. We show that the sum-of-squared differences of FDs can be computed without explicitly de-rotating the contours. We compare our correlation based matching against affine-invariant Fourier descriptors (AFDs) and demonstrate that our correlation based approach outperforms AFDs on real world data.©2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.Fredrik Larsson, Michael Felsberg and Per-Erik Forssén, Patch Contour Matching by Correlating Fourier Descriptors, 2009, Digital Image Computing: Techniquesand Applications (DICTA), Melbourne, Australia, December 2009. IEEE Computer Society