Exploring Single Event Effects in the ALICE (A Large Ion Collider Experiment) SAMPA chip

After the second Long-Shutdown at the Large Hadron Collider, improved resolution requirements for the tracking detectors of the High Energy Physics experiments demand a higher number of readout channels and more compact front-end electronics. In this context, the "SAMPA" chip is developed to fulfill readout requirements of multiple detectors at the ALICE (A Large Ion Collider Experiment) experiment. As the SAMPA chip is fabricated in a commercial CMOS technology, the radiation hardness assurance of the chip was imperative for ensuring its reliable and acceptable operation in the ALICE radiation environment. This is accomplished by conducting high-energy protons, heavy-ions, and pulsed-laser irradiation campaigns on various prototypes of the SAMPA chip. During protons exposure of the second prototype, destructive Single Event Latch-up (SEL) events were detected. Dedicated collimator tests with the heavy-ions and pulsed-laser tests were conducted to identify the primary source of SEL events in the prototype. Consequently, the SEL sensitivity was improved in the final SAMPA version and another heavy-ions campaign was conducted to confirm its robustness against SEL events