Magnetic scanning probe calibration using graphene hall sensor

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (Bprobe) for quantitative measurements. We present a straightforward calibration of B probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined Bprobe ∼ 70 mT and ∼ 76 mT for probes with nominal magnetic moment ∼ 1 × 10-13 and > 3 × 10-13 emu, respectively, at a probe-sample distance of 20 nm. © 2013 IEEE.This work was partly supported by projects Concept Graphene, IRD Graphene, MetMags and CSD2010-00024.Peer Reviewe