A multiscale modeling approach for the simulation of OxRRAM devices

We present a multiscale modeling platform that exploits ab-initio calculation results and a material-related description of the most relevant defect-related phenomena in dieledtrics (charge trapping and transport, degradation and atomic species motion) to interpret and understand the electrical characteristics of OxRAM memory devices for non-volatile memories and neuromorphic applications. Simulation results provide a deep and quantitative understanding of the factors controlling device operation. The proposed multiscale modeling platform represents a powerful tool for investigating material properties and optimizing device performances and reliability