Trabajo presentado al 13th LATW celebrado en Quito del 10 al 13 de abril de 2012.This work proposes a generic path to improve Alternate Test strategies. It demonstrates that multi-condition test increases the amount of information present in the test data and consequently decreases the prediction error of the trained models. The ambition of this paper is to be a methodological contribution to the field of AMS-RF test, and formal guidelines are provided that justify the interest of the approach. For the sake of validation, the proposed methodology has been applied to several alternate test strategies for analog, mixed signal, and RF circuits. Promising results are found for the following case studies: an analog filter, a Σ∆ A/D converter, an...
With the ever increasing demands for high complexity consumer electronic products, market pressures ...
This paper presents a discussion on several methods that can be used to improve the testability of m...
ISBN : 978-3-9810801-2-4For Design-For-Test (DFT) purposes, analogue and mixed-signal testing has to...
International audienceTesting analog, mixed-signal and RF (AMS-RF) cir- cuits represents a significa...
International audienceMuch progress has been achieved in the domain of Analog/Mixed-Signal (AMS) and...
In this paper, multi-frequency test is presented, which can maximize differences between the failure...
ISBN : 978-2-84813-173-3Analogue-mixed-signal (AMS) and Radio frequency (RF) devices are required in...
Analogue-mixed-signal (AMS) and Radio frequency (RF) devices are required in many applications such ...
The role of nano-electronic systems is rapidly expanding in every facet of modern life. Testing the ...
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion o...
This paper is a practical illustration of the adoption of alternate tests based upon the judicious s...
International audienceThis paper is in the field of Analog or RF integrated circuit testing. The con...
ISBN : 978-84-8081-401-0International audienceLengthy test times and highly sophisticated test equip...
Conventionally, the performances of Analog and Mixed-Signal (AMS) circuits have been characterized u...
International audienceTesting analog, mixed-signal and RF circuits represents the main cost componen...
With the ever increasing demands for high complexity consumer electronic products, market pressures ...
This paper presents a discussion on several methods that can be used to improve the testability of m...
ISBN : 978-3-9810801-2-4For Design-For-Test (DFT) purposes, analogue and mixed-signal testing has to...
International audienceTesting analog, mixed-signal and RF (AMS-RF) cir- cuits represents a significa...
International audienceMuch progress has been achieved in the domain of Analog/Mixed-Signal (AMS) and...
In this paper, multi-frequency test is presented, which can maximize differences between the failure...
ISBN : 978-2-84813-173-3Analogue-mixed-signal (AMS) and Radio frequency (RF) devices are required in...
Analogue-mixed-signal (AMS) and Radio frequency (RF) devices are required in many applications such ...
The role of nano-electronic systems is rapidly expanding in every facet of modern life. Testing the ...
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion o...
This paper is a practical illustration of the adoption of alternate tests based upon the judicious s...
International audienceThis paper is in the field of Analog or RF integrated circuit testing. The con...
ISBN : 978-84-8081-401-0International audienceLengthy test times and highly sophisticated test equip...
Conventionally, the performances of Analog and Mixed-Signal (AMS) circuits have been characterized u...
International audienceTesting analog, mixed-signal and RF circuits represents the main cost componen...
With the ever increasing demands for high complexity consumer electronic products, market pressures ...
This paper presents a discussion on several methods that can be used to improve the testability of m...
ISBN : 978-3-9810801-2-4For Design-For-Test (DFT) purposes, analogue and mixed-signal testing has to...