Add to ORKGABSTRACT Noise in piezoresistors can be divided into two types: Johnson or white noise and 1/f noise. Johnson noise is uniform across all frequencies and depends on the resistance and temperature. 1/f noise is a conductance fluctuation that has been shown to be related to piezoresistor fabrication parameters such as anneal temperature and surface effects. This study presents a collection of controlled piezoresistor fabrication runs with associated noise data and design rules and operation conditions for noise reduction in piezoresistors
Minimizing electrical noise is an increasingly important topic. New systems and modulation technique...
Low frequency, 1/f noise measurements on a number of silicon dioxide gate dielectric based commercia...
Measurement results are presented from 0.1 Hz to 100 kHz of 1/f and thermal noise in different n-JFE...
A good cantilever should possess a small minimum detectable deflection (MDD), which depends on the m...
Low frequency noise measurements can be used as a tool in diagnostics of silicon diaphragm-based pie...
SPICE models of a piezoelectric device and the ultrasound propagation medium can be used in a simula...
In this article, the sensitivity and the noise of piezoresistive cantilevers were systematically inv...
Abstract: The work reports the measurements of the excess-noise coming from the thick-film piezo-res...
The measurement and analysis of low level vibrations and Acoustic Emissions in components, fabricati...
Piezoresistive sensors convert a physical value into a resistance variation. Often four resistive el...
The main objective of the thesis „Electronic noise temperature dependence of piezoceramic sensors“ i...
This paper presents a detailed analysis on the impact of electrode materials and dimensions on flick...
The piezoelectric ceramic belongs to materials with widespread spectrum of applications. It can be f...
Thermal noise and 1/f noise are investigated at room conditions in three kinds of basic off-the-shel...
The paper gives an overview of low-frequency (LF) noise studies in advanced logic and memory devices...
Minimizing electrical noise is an increasingly important topic. New systems and modulation technique...
Low frequency, 1/f noise measurements on a number of silicon dioxide gate dielectric based commercia...
Measurement results are presented from 0.1 Hz to 100 kHz of 1/f and thermal noise in different n-JFE...
A good cantilever should possess a small minimum detectable deflection (MDD), which depends on the m...
Low frequency noise measurements can be used as a tool in diagnostics of silicon diaphragm-based pie...
SPICE models of a piezoelectric device and the ultrasound propagation medium can be used in a simula...
In this article, the sensitivity and the noise of piezoresistive cantilevers were systematically inv...
Abstract: The work reports the measurements of the excess-noise coming from the thick-film piezo-res...
The measurement and analysis of low level vibrations and Acoustic Emissions in components, fabricati...
Piezoresistive sensors convert a physical value into a resistance variation. Often four resistive el...
The main objective of the thesis „Electronic noise temperature dependence of piezoceramic sensors“ i...
This paper presents a detailed analysis on the impact of electrode materials and dimensions on flick...
The piezoelectric ceramic belongs to materials with widespread spectrum of applications. It can be f...
Thermal noise and 1/f noise are investigated at room conditions in three kinds of basic off-the-shel...
The paper gives an overview of low-frequency (LF) noise studies in advanced logic and memory devices...
Minimizing electrical noise is an increasingly important topic. New systems and modulation technique...
Low frequency, 1/f noise measurements on a number of silicon dioxide gate dielectric based commercia...
Measurement results are presented from 0.1 Hz to 100 kHz of 1/f and thermal noise in different n-JFE...