Non Invasive, Multi-length Scale Characterization of Smart Materials, Membranes, Sensors with a novel high resolution and high contrast CT

Abstract. We describe a novel lab-based x-ray CT (computed tomography) system for rapid non invasive multilength scale 3D characterization of internal structures of advanced and smart materials, from composites to sensors, from mm to sub 50 nm spatial resolution and with sample dimensions from several cm to microns. Notwithstanding most smart materials and sensors are in a matrix of low Z polymer or composites (making them challenging for x-ray radiography), the novel CT has excellent contrast. Several materials of interest to the military and home land security such as composites, polymers, micro and nano materials, protective materials against projectiles and blasting, smart self healing materials, fuel cell membranes and sensors and medical implants will be discussed. The key to this technology lies in proprietary x-ray optics, including Fresnel Zone plates and high resolution and high contrast detectors fabricated by Xradia