A New Statistic for Detecting Outliers in Exponential Case

Abstract: Zerbet and Nikulin presented the new statistic Z k for detecting outliers in exponential distribution. In this article, we propose a statistic (T k ) different from the well known Dixon's statistic D k and similar to the statistic Z k to test for multiple outliers. Distribution of the test based on this new statistic under slippage alternatives is obtained. The power of the new test is also calculated, it is compared to the power of the statistic D k . The results show that the test based on statistic T k is more powerful than the test based on the statistic D k