Add to ORKGAbstract We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and ...
Abstract We present both proton and heavy ion single event effect (SEE) ground test results for cand...
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and ...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Total ionizing dose, displacement damage dose, and single-event effect testing were performed to cha...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of Single Event Effects (SEE) testing with high energy protons and with low a...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
Abstract-- Sensitivity of a variety of candidate spacecraft electronics to total ionizing dose and d...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and ...
Abstract We present both proton and heavy ion single event effect (SEE) ground test results for cand...
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and ...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Total ionizing dose, displacement damage dose, and single-event effect testing were performed to cha...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of Single Event Effects (SEE) testing with high energy protons and with low a...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
Abstract-- Sensitivity of a variety of candidate spacecraft electronics to total ionizing dose and d...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...