Includes bibliographical references (page 1216).We have acquired images with a spatial resolution better than 38 nm by using a tabletop microscope that combines 13 nm wavelength light from a high-brightness tabletop laser and Fresnel zone plate optics. These results open a gateway to the development of compact and widely available extreme-ultraviolet imaging tools capable of inspecting samples in a variety of environments with a 15-20 nm spatial resolution and a picosecond time resolution
AbstractScanning electron microscopy and atomic force microscopy are well-established techniques for...
We present a table-top coherent diffractive imaging (CDI) experiment based on high-order harmonics g...
Patterning with extreme ultraviolet light generated by a compact, bright laser source operating at a...
As the dimensions of integrated circuits continue to decrease, new metrology tools that acan inspect...
We describe recent advances in the demonstration of table-top full field microscopes that use soft x...
Includes bibliographical references (page 25).Recent advances in nanotechnology and nanoscience have...
A compact, desktop size microscope, based on laser-plasma source and equipped with reflective conden...
A compact, desktop size microscope, based on laser-plasma source and equipped with reflective conden...
We have demonstrated near-wavelength resolution microscopy in the extreme ultraviolet. Images of 50 ...
A tabletop, extreme ultraviolet (EUV) imaging system with nanometer-scale resolution has been develo...
High resolution imaging methods and techniques are currently under development. One of them is an ex...
We report the demonstration of a reflection microscope that operates at 13.2-nm wavelength with a sp...
Various imaging methods and techniques capable of reaching a nanometer spatial resolution are curren...
We report on a very compact desk-top transmission extreme ultraviolet (EUV) microscope based on a la...
Radiation in the extreme ultraviolet (EUV) spectral range is of interest for lithography and microsc...
AbstractScanning electron microscopy and atomic force microscopy are well-established techniques for...
We present a table-top coherent diffractive imaging (CDI) experiment based on high-order harmonics g...
Patterning with extreme ultraviolet light generated by a compact, bright laser source operating at a...
As the dimensions of integrated circuits continue to decrease, new metrology tools that acan inspect...
We describe recent advances in the demonstration of table-top full field microscopes that use soft x...
Includes bibliographical references (page 25).Recent advances in nanotechnology and nanoscience have...
A compact, desktop size microscope, based on laser-plasma source and equipped with reflective conden...
A compact, desktop size microscope, based on laser-plasma source and equipped with reflective conden...
We have demonstrated near-wavelength resolution microscopy in the extreme ultraviolet. Images of 50 ...
A tabletop, extreme ultraviolet (EUV) imaging system with nanometer-scale resolution has been develo...
High resolution imaging methods and techniques are currently under development. One of them is an ex...
We report the demonstration of a reflection microscope that operates at 13.2-nm wavelength with a sp...
Various imaging methods and techniques capable of reaching a nanometer spatial resolution are curren...
We report on a very compact desk-top transmission extreme ultraviolet (EUV) microscope based on a la...
Radiation in the extreme ultraviolet (EUV) spectral range is of interest for lithography and microsc...
AbstractScanning electron microscopy and atomic force microscopy are well-established techniques for...
We present a table-top coherent diffractive imaging (CDI) experiment based on high-order harmonics g...
Patterning with extreme ultraviolet light generated by a compact, bright laser source operating at a...