We consider spatially homogeneous marked point patterns in an unboundedly expanding convex sampling window. Our main objective is to identify the distribution of the typical mark by constructing an asymptotic chi-square-goodness-of-fit test. The corresponding test statistic is based on a natural empirical version of the Palm mark distribution and a smoothed covariance estimator which turns out to be mean-square consistent. Our approach does not require independent marks and allows dependences between the mark field and the point pattern. Instead we impose a suitable beta-mixing condition on the underlying stationary marked point process which can be checked for a number of Poisson-based models and, in particular, in the case of geostatistic...
We prove two functional limit theorems for empirical multiparameter second moment functions (general...
This work presents an alternative derivation of the asymptotic distribution of Ripley's K-function f...
Spatial point processes are mathematical models for irregular or random point patterns in the d-dime...
We consider spatially homogeneous marked point patterns in an unboundedly expanding convex sampling ...
We prove the asymptotic normality of kernel estimators of second- and higher-order product densities...
Aggregation patterns are often visually detected in sets of location data. These clusters ...
International audienceAggregation patterns are often visually detected in sets of location data. The...
We study the asymptotic behaviour of the empirical distribution function derived from a stationary ...
International audienceThe inspection of residuals is a fundamental step to investigate the quality o...
AbstractWe study the asymptotic behaviour of the empirical distribution function derived from a stat...
The distribution of a variable observed over a domain depends on the underlying process and also on...
International audienceThe distribution of a variable observed over a domain depends on the underlyin...
We study sequences of scaled edge-corrected empirical (generalized) K-functions (modifying Ripley's ...
We discuss the prediction of the sample variance of marks of a marked spatial point process on a con...
The paper develops an asymptotically valid F test that is robust to spatial autocorre-lation in a GM...
We prove two functional limit theorems for empirical multiparameter second moment functions (general...
This work presents an alternative derivation of the asymptotic distribution of Ripley's K-function f...
Spatial point processes are mathematical models for irregular or random point patterns in the d-dime...
We consider spatially homogeneous marked point patterns in an unboundedly expanding convex sampling ...
We prove the asymptotic normality of kernel estimators of second- and higher-order product densities...
Aggregation patterns are often visually detected in sets of location data. These clusters ...
International audienceAggregation patterns are often visually detected in sets of location data. The...
We study the asymptotic behaviour of the empirical distribution function derived from a stationary ...
International audienceThe inspection of residuals is a fundamental step to investigate the quality o...
AbstractWe study the asymptotic behaviour of the empirical distribution function derived from a stat...
The distribution of a variable observed over a domain depends on the underlying process and also on...
International audienceThe distribution of a variable observed over a domain depends on the underlyin...
We study sequences of scaled edge-corrected empirical (generalized) K-functions (modifying Ripley's ...
We discuss the prediction of the sample variance of marks of a marked spatial point process on a con...
The paper develops an asymptotically valid F test that is robust to spatial autocorre-lation in a GM...
We prove two functional limit theorems for empirical multiparameter second moment functions (general...
This work presents an alternative derivation of the asymptotic distribution of Ripley's K-function f...
Spatial point processes are mathematical models for irregular or random point patterns in the d-dime...