In this thesis we report the development of the force feedback microscopy technique, an alternative methodology to the conventional atomic force microscope. This novel technique replaces some core instrumental subsystems of conventional AFMs, leading to several key differences in its function, which were explored during the work performed. We report here the development of a prototype of this instrument, specifically designed to showcase the key advantages of the force feedback microscopy technique. The new instrument was the object of a comprehensive characterization, with the development of several calibration protocols which took advantages of the technique’s main valences to provide direct, traceable measurements of the instrument perfo...
The scanning probe microscope (SPM) is a high precision measurement research equipment that enables ...
Condensed Matter Group and BIONTH (Bio- and Nano-Technologies for Health) Centre, School of Contempo...
The Atomic Force Microscope (AFM) is a key member of the Scanning Probe Microscope (SPM) family. Its...
In this thesis we report the development of the force feedback microscopy technique, an alternative ...
Since its invention in 1986, the atomic force microscopes (AFMs) have been powerful tools for the ch...
The force between two interacting particles as a function of distance is one of the most fundamental...
Since its invention in 1986, the atomic force microscopes (AFMs) have been powerful tools for the ch...
Since the innovator speech of Nobel laureate Richard Feynman in the early 1959, the progress of nano...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
<p>This research describes the development of a state-of-the-art atomic force microscope (AFM) for i...
La mesure quantitative de propriétés mécaniques à l’échelle nanométrique en matière molle est un rée...
This paper offers a concise survey of the most commonly used feedback loops for atomic force microsc...
International audienceToday, Scanning Probe Microscopies (SPM) are widely used in physics, chemistry...
High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynam...
In this thesis a dedicated Atomic Force Microscopy (AFM) setup is used for imaging biochemical react...
The scanning probe microscope (SPM) is a high precision measurement research equipment that enables ...
Condensed Matter Group and BIONTH (Bio- and Nano-Technologies for Health) Centre, School of Contempo...
The Atomic Force Microscope (AFM) is a key member of the Scanning Probe Microscope (SPM) family. Its...
In this thesis we report the development of the force feedback microscopy technique, an alternative ...
Since its invention in 1986, the atomic force microscopes (AFMs) have been powerful tools for the ch...
The force between two interacting particles as a function of distance is one of the most fundamental...
Since its invention in 1986, the atomic force microscopes (AFMs) have been powerful tools for the ch...
Since the innovator speech of Nobel laureate Richard Feynman in the early 1959, the progress of nano...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
<p>This research describes the development of a state-of-the-art atomic force microscope (AFM) for i...
La mesure quantitative de propriétés mécaniques à l’échelle nanométrique en matière molle est un rée...
This paper offers a concise survey of the most commonly used feedback loops for atomic force microsc...
International audienceToday, Scanning Probe Microscopies (SPM) are widely used in physics, chemistry...
High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynam...
In this thesis a dedicated Atomic Force Microscopy (AFM) setup is used for imaging biochemical react...
The scanning probe microscope (SPM) is a high precision measurement research equipment that enables ...
Condensed Matter Group and BIONTH (Bio- and Nano-Technologies for Health) Centre, School of Contempo...
The Atomic Force Microscope (AFM) is a key member of the Scanning Probe Microscope (SPM) family. Its...