Highly charged ion X-rays from Electron-Cyclotron Resonance Ion Sources
- Indelicato, P.
- Boucard, S.
- Simons, L. M.
- Stingelin, L.
- Trassinelli, M.
- Veloso, J.
- Wasser, A.
- Zmeskal, J.
- Covita, D. S.
- Gotta, D.
- Gruber, A.
- Hirtl, A.
- Fuhrmann, H.
- Le Bigot, E.-O.
- Schlesser, S.
- dos Santos, J. M. F.
Publication date
January 2007
DOI Publisher
Elsevier BV ISSN
0168-9002 Citation count (estimate)
5Abstract
Radiation from the highly charged ions contained in the plasma of Electron-Cyclotron Resonance Ion Sources (ECRISs) constitutes a very bright source of X-rays. Because the ions have a relatively low kinetic energy (approximate to 1 eV) transitions can be very narrow, containing only a small Doppler broadening. We describe preliminary accurate measurements of two and three-electron ions with Z = 16-18. We show how these measurement can test sensitively many-body relativistic calculations or can be used as X-ray standards for precise measurements of X-ray transitions in exotic atoms. (C) 2007 Published by Elsevier B.V
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